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A Review: Ultrahigh-Vacuum Technology for Electron Microscopes

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes
A Book

by Nagamitsu Yoshimura

  • Publisher : Academic Press
  • Release : 2020-02-15
  • Pages : 568
  • ISBN : 012819703X
  • Language : En, Es, Fr & De
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A Review: Ultrahigh-Vacuum Technology for Electron Microscopes provides information on the fundamentals of ultra-high vacuum systems. It covers the very subtle process that can help increase pressure inside the microscope (or inside any other ultra-high vacuum system) and the different behavior of the molecules contributing to this kind of process. Prof Yoshimura’s book offers detailed information on electron microscope components, as well as UHV technology. This book is an ideal resource for industrial microscopists, engineers and scientists responsible for the design, operation and maintenance of electron microscopes. In addition, engineering students or engineers working with electron microscopes will find it useful. Teaches how to incorporate diffusion pumps for UHV electron microscopy Presents the work of an author who brings a lifetime of experience working on vacuum technology and electron microscopes

Foundations of Molecular-Flow Networks for Vacuum System Analysis

Foundations of Molecular-Flow Networks for Vacuum System Analysis
A Book

by Nagamitsu Yoshimura

  • Publisher : Academic Press
  • Release : 2019-11-13
  • Pages : 208
  • ISBN : 0128186887
  • Language : En, Es, Fr & De
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Foundations of Molecular-Flow Networks for Vacuum System Analysis is the only book that covers desorption, adsorption and outgassing in relation to molecular-flow networks. It will be beneficial for academics, students and industry personnel working in the field of ultra-high vacuums for designing the equipment/set-up and as a guide to understand the processes relating to vacuums. The book is fully supported with equations and case studies from industry. Vacuum technology is extensively used in large synchrotrons and other large accelerators, as well as in many other smaller industrial and scientific facilities. Hence, this book is a welcome addition to the literature. Explains how to design, model and simulate vacuum systems to obtain satisfactory pressure distributions Offers a practical description of molecular flow, providing techniques to design molecular flow networks of vacuum systems and processes Explores equivalence with electrical components to help readers with simulation using free software such as LTSPICE

Vacuum Technology

Vacuum Technology
Practice for Scientific Instruments

by Nagamitsu Yoshimura

  • Publisher : Springer Science & Business Media
  • Release : 2007-12-04
  • Pages : 353
  • ISBN : 3540744339
  • Language : En, Es, Fr & De
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In this book, Yoshimura provides a review of the UHV related development during the last decades. His very broad experience in the design enables him to present us this detailed reference. After a general description how to design UHV systems, he covers all important issue in detail, like pumps, outgasing, Gauges, and Electrodes for high voltages. Thus, this book serves as reference for everybody using UVH in scientific equipment.

Bibliographies of Interest to the Atomic Energy Program, 1962 Through 1966

Bibliographies of Interest to the Atomic Energy Program, 1962 Through 1966
A Book

by U.S. Atomic Energy Commission

  • Publisher : Unknown Publisher
  • Release : 1968
  • Pages : 250
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Energy-Filtering Transmission Electron Microscopy

Energy-Filtering Transmission Electron Microscopy
A Book

by Ludwig Reimer

  • Publisher : Springer
  • Release : 2013-06-29
  • Pages : 425
  • ISBN : 3540489959
  • Language : En, Es, Fr & De
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Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.

Advances in Optical and Electron Microscopy

Advances in Optical and Electron Microscopy
A Book

by T Mulvey,C. J. R. Sheppard

  • Publisher : Academic Press
  • Release : 2013-10-22
  • Pages : 198
  • ISBN : 1483282244
  • Language : En, Es, Fr & De
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Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy. This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging. This publication is a beneficial to students and individuals researching on optical and electron microscopy.

Structure and Dynamics of Surfaces I

Structure and Dynamics of Surfaces I
A Book

by W. Schommers,P.v. Blanckenhagen

  • Publisher : Springer Science & Business Media
  • Release : 2013-03-08
  • Pages : 282
  • ISBN : 3642465749
  • Language : En, Es, Fr & De
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During the last decade, surface research has clearly shifted its interest from the macroscopic to the microscopic scale; a wealth of novel experimental techniques and theoretical methods have been applied and developed successfully. The Topics volume at hand gives an account of this tendency. For the understanding of surface phenomena and their exploitation in tech nical applications, the theoretical and experimental analysis at the microscopic level is of particular interest. In heterogeneous catalysis, for example, a chemical reaction takes place at the interface of two phases, and the process occurring at the surface is composed of a sequence of individual microscopic steps. These individual steps include adsorption, desorption, surface diffusion, and reaction on the surface. These elementary steps are greatly influenced by the structure and the dynamics of the surface region. Especially the catalytic activity may strongly depend on the structure of the catalyst's surface. The necessity of per forming surface investigations on a microscopic scale is also reflected clearly in research work relating to metal-semiconductor interfaces which determine es sentially the properties of electronic device materials. The experimental probe on the atomic scale, coupled with parallel theoretical calculations, showed that the electronic properties of a metal-semiconductor interface strongly depend on the crystallographic structure of the semiconductor; in particular, it is im portant to know in this context the modification of the atomic arrangement in the surface region caused by the termination of the crystal by the surface.

Bibliography of Mass Spectroscopy Literature for 1970

Bibliography of Mass Spectroscopy Literature for 1970
Compiled by a Computer Method

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1972
  • Pages : 880
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Treatise on Materials Science and Technology

Treatise on Materials Science and Technology
A Book

by Herbert Herman

  • Publisher : Elsevier
  • Release : 2017-01-31
  • Pages : 336
  • ISBN : 1483218139
  • Language : En, Es, Fr & De
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Treatise on Materials Science and Technology, Volume 4 covers the fundamental properties and characterization of materials, ranging from simple solids to complex heterophase systems. The book covers articles on advanced techniques by which thin films may be characterized; on diffusion in substitutional alloys; and on solid solution strengthening in face-centered cubic alloys. The text also includes articles on the thermodynamics of binary ordered intermetallic phases; and the major aspects of metal powder processing. Professional scientists and engineers, as well as graduate students in materials science and associated fields will find the book invaluable.

Nanofabrication Handbook

Nanofabrication Handbook
A Book

by Stefano Cabrini,Satoshi Kawata

  • Publisher : CRC Press
  • Release : 2012-02-24
  • Pages : 546
  • ISBN : 1420090526
  • Language : En, Es, Fr & De
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While many books are dedicated to individual aspects of nanofabrication, there is no single source that defines and explains the total vision of the field. Filling this gap, Nanofabrication Handbook presents a unique collection of new and the most important established approaches to nanofabrication. Contributors from leading research facilities and academic institutions around the world define subfields, offer practical instructions and examples, and pave the way for future research. Helping readers to select the proper fabricating technique for their experiments, the book provides a broad vision of the most critical problems and explains how to solve them. It includes basic definitions and introduces the main underlying concepts of nanofabrication. The book also discusses the major advantages and disadvantages of each approach and offers a wide variety of examples of cutting-edge applications. Each chapter focuses on a particular method or aspect of study. For every method, the contributors describe the underlying theoretical basis, resolution, patterns and substrates used, and applications. They show how applications at the nanoscale require a different process and understanding than those at the microscale. For each experiment, they elucidate key solutions to problems relating to materials, methods, and surface considerations. A complete resource for this rapidly emerging interdisciplinary field, this handbook provides practical information for planning the experiments of any project that employs nanofabrication techniques. It gives readers a foundation to enter the complex world of nanofabrication and inspires the scientific community at large to push the limits of nanometer resolution.

Specimen Handling, Preparation, and Treatments in Surface Characterization

Specimen Handling, Preparation, and Treatments in Surface Characterization
A Book

by Alvin W. Czanderna,Cedric J. Powell,Theodore E. Madey

  • Publisher : Springer Science & Business Media
  • Release : 2006-04-11
  • Pages : 302
  • ISBN : 0306469138
  • Language : En, Es, Fr & De
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With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ray, and ion beam techniques to determine the structure and composition of interfaces, activities in the field of surface science grew nearly exponentially. Today surface science impacts all major fields of study from physical to biological sciences, from physics to chemistry, and all engineering disciplines. The materials and phenomena characterized by surface science range from se- conductors, where the impact of surface science has been critical to progress, to metals and ceramics, where selected contributions have been important, to bio- terials, where contributions are just beginning to impact the field, to textiles, where the impact has been marginal. With such a range of fields and applications, questions about sample selection, preparation, treatment, and handling are difficult to cover completely in one review article or one chapter. Therefore, the editors of this book have assembled a range of experts with experience in the major fields impacted by surface characterization. It is the only book which treats the subject of sample handling, preparation, and treatment for surface characterization. It is full of tricks, cautions, and handy tips to make the laboratory scientist’s life easier. With respect to organization of the book, the topics range from discussion of vacuum to discussion of biological, organic, elemental or compound samples, to samples prepared ex situ or in situ to the vacuum, to deposition ofthin films. Generic considerations of sample preparation are also given.

Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy
Imaging and Analysis

by Stephen J. Pennycook,Peter D. Nellist

  • Publisher : Springer Science & Business Media
  • Release : 2011-03-24
  • Pages : 762
  • ISBN : 9781441972002
  • Language : En, Es, Fr & De
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Handbook of Materials Characterization

Handbook of Materials Characterization
A Book

by Surender Kumar Sharma

  • Publisher : Springer
  • Release : 2018-09-18
  • Pages : 613
  • ISBN : 3319929550
  • Language : En, Es, Fr & De
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This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Atomistic Aspects of Epitaxial Growth

Atomistic Aspects of Epitaxial Growth
A Book

by Miroslav Kotrla,Nicolas I. Papanicolaou,Dimitri Vvedensky,Luc T. Wille

  • Publisher : Springer Science & Business Media
  • Release : 2012-12-06
  • Pages : 604
  • ISBN : 9401003912
  • Language : En, Es, Fr & De
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Epitaxial growth lies at the heart of a wide range of industrial and technological applications. Recent breakthroughs, experimental and theoretical, allow actual atom-by-atom manipulation and an understanding of such processes, opening up a totally new area of unprecedented nanostructuring. The contributions to Atomistic Aspects of Epitaxial Growth are divided into five main sections, taking the reader from the atomistic details of surface diffusion to the macroscopic description of epitaxial systems. many of the papers contain substantial background material on theoretical and experimental methods, making the book suitable for both graduate students as a supplementary text in a course on epitaxial phenomena, and for professionals in the field.

Biological Low-Voltage Scanning Electron Microscopy

Biological Low-Voltage Scanning Electron Microscopy
A Book

by James Pawley,Heide Schatten

  • Publisher : Springer Science & Business Media
  • Release : 2007-12-03
  • Pages : 317
  • ISBN : 9780387729725
  • Language : En, Es, Fr & De
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Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. Although this imaging technique has undergone tremendous developments, it is still poorly represented in the literature, limited to journal articles and chapters in books. This comprehensive volume is dedicated to the theory and practical applications of FESEM in biological samples. It provides a comprehensive explanation of instrumentation, applications, and protocols, and is intended to teach the reader how to operate such microscopes to obtain the best quality images.

Auger Electron Spectroscopy

Auger Electron Spectroscopy
A Bibliography: 1925–1975

by Donald T. Hawkins

  • Publisher : Springer Science & Business Media
  • Release : 2012-12-06
  • Pages : 298
  • ISBN : 1468413872
  • Language : En, Es, Fr & De
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Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.

Scanning Electron Microscopy

Scanning Electron Microscopy
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1986
  • Pages : 129
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.

High-Resolution Transmission Electron Microscopy

High-Resolution Transmission Electron Microscopy
and Associated Techniques

by Peter Buseck,John Cowley,LeRoy Eyring

  • Publisher : Oxford University Press
  • Release : 1989-02-02
  • Pages : 670
  • ISBN : 9780195364651
  • Language : En, Es, Fr & De
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This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.

Surface Microscopy with Low Energy Electrons

Surface Microscopy with Low Energy Electrons
A Book

by Ernst Bauer

  • Publisher : Springer
  • Release : 2014-07-10
  • Pages : 496
  • ISBN : 1493909355
  • Language : En, Es, Fr & De
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This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

Nuclear Science Abstracts

Nuclear Science Abstracts
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1975
  • Pages : 129
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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