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Analysis of Step-Stress Models

Analysis of Step-Stress Models
Existing Results and Some Recent Developments

by Debasis Kundu,Ayon Ganguly

  • Publisher : Academic Press
  • Release : 2017-06-29
  • Pages : 186
  • ISBN : 0081012403
  • Language : En, Es, Fr & De
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Analysis of Step-Stress Models: Existing Results and Some Recent Developments describes, in detail, the step-stress models and related topics that have received significant attention in the last few years. Although two books, Bagdonavicius and Nikulin (2001) and Nelson (1990), on general accelerated life testing models are available, no specific book is available on step-stress models. Due to the importance of this particular topic, Balakrishnan (2009) provided an excellent review for exponential step-stress models. The scope of this book is much more, providing the inferential issues for different probability models, both from the frequentist and Bayesian points-of-view. Explains the different distributions of the Cumulative Exposure Mode Covers many different models used for step-stress analysis Discusses Step-stress life testing under the competing or complementary risk model

Handbook of Reliability Engineering

Handbook of Reliability Engineering
A Book

by Hoang Pham

  • Publisher : Springer Science & Business Media
  • Release : 2006-04-18
  • Pages : 663
  • ISBN : 1852338415
  • Language : En, Es, Fr & De
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An effective reliability programme is an essential component of every product's design, testing and efficient production. From the failure analysis of a microelectronic device to software fault tolerance and from the accelerated life testing of mechanical components to hardware verification, a common underlying philosophy of reliability applies. Defining both fundamental and applied work across the entire systems reliability arena, this state-of-the-art reference presents methodologies for quality, maintainability and dependability. Featuring: Contributions from 60 leading reliability experts in academia and industry giving comprehensive and authoritative coverage. A distinguished international Editorial Board ensuring clarity and precision throughout. Extensive references to the theoretical foundations, recent research and future directions described in each chapter. Comprehensive subject index providing maximum utility to the reader. Applications and examples across all branches of engineering including IT, power, automotive and aerospace sectors. The handbook's cross-disciplinary scope will ensure that it serves as an indispensable tool for researchers in industrial, electrical, electronics, computer, civil, mechanical and systems engineering. It will also aid professional engineers to find creative reliability solutions and management to evaluate systems reliability and to improve processes. For student research projects it will be the ideal starting point whether addressing basic questions in communications and electronics or learning advanced applications in micro-electro-mechanical systems (MEMS), manufacturing and high-assurance engineering systems.

Stochastic Models of Random Fatigue Under Step-stress Accelerated Life Test and Their Application in Bioassay and Clinical Trials

Stochastic Models of Random Fatigue Under Step-stress Accelerated Life Test and Their Application in Bioassay and Clinical Trials
A Book

by Yili Lu

  • Publisher : Unknown Publisher
  • Release : 1994
  • Pages : 308
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Accelerated Testing

Accelerated Testing
Statistical Models, Test Plans, and Data Analysis

by Wayne Nelson

  • Publisher : Wiley-Interscience
  • Release : 1990-02-16
  • Pages : 601
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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In recent years, much useful methodology has been developed in accelerated testing--this book makes it available to practitioners. Many products last so long that life testing at design conditions is impractical. However, these products can be life-tested at high-stress conditions to yield failures quickly. Such testing saves much time and money--and analyses of data from an accelerated test yield needed information on product life at design (low stress) conditions. Presents practical, modern, statistical methods for accelerated testing including test models, analyses of data and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. Contains many real test examples along with data analyses, computer programs and references to the literature.

Calcutta Statistical Association Bulletin

Calcutta Statistical Association Bulletin
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2007
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Signals

Signals
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1991
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Semiparametric Models in Accelerated Life Testing

Semiparametric Models in Accelerated Life Testing
A Book

by Vilijandas Bagdonavičius,Mikhail Stepanovich Nikulin,Queen's University (Kingston, Ont.)

  • Publisher : Kingston, Ont. : Queen's University
  • Release : 1995
  • Pages : 70
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Proceedings of the Section on Physical and Engineering Sciences

Proceedings of the Section on Physical and Engineering Sciences
A Book

by American Statistical Association. Section on Physical and Engineering Sciences

  • Publisher : Unknown Publisher
  • Release : 1995
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Naval Research Logistics

Naval Research Logistics
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1994
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Electronic Component Reliability

Electronic Component Reliability
Fundamentals, Modelling, Evaluation, and Assurance

by Finn Jensen

  • Publisher : Wiley-Blackwell
  • Release : 1995
  • Pages : 355
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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This book includes an introduction to some important reliability concepts and a review of terminology. The work is divided into three sections: modelling, evaluation and assurance.

Reliability Analysis in Engineering Applications

Reliability Analysis in Engineering Applications
A Book

by Shu-Ho Dai,Ming-O Wang

  • Publisher : Van Nostrand Reinhold Company
  • Release : 1992
  • Pages : 433
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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All current models used in reliability analysis and how they apply to engineering design problems are covered here. Reliability engineers, maintenance engineers, and safety engineers will find vital data on reliability testing and prediction, as well as guidelines for solving problems in fracture mechanics and fatigue. Also covered are applications of fuzzy sets. Over 60 examples illustrate definitions, theories and models that make use of actual or simulated data.

Proceedings of the National Science Council, Republic of China

Proceedings of the National Science Council, Republic of China
Part A, Physical science and engineering

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1999
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Space Programs Summary

Space Programs Summary
Supporting research and advanced development. v. 3

by Jet Propulsion Laboratory (U.S.)

  • Publisher : Unknown Publisher
  • Release : 1969-08
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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China Science & Technology Abstracts

China Science & Technology Abstracts
Chung-kuo Kʻo Chi Wen Chai. Mathematics, astronomy, physics

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1985
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Mathematical Reviews

Mathematical Reviews
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2004
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Internationale Statistische Rundschau

Internationale Statistische Rundschau

by Corrado Gini

  • Publisher : Unknown Publisher
  • Release : 2007
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Includes list of publications received.

Additive and Multiplicative Semiparametric Models in Accelerated Life Testing and Survival Analysis

Additive and Multiplicative Semiparametric Models in Accelerated Life Testing and Survival Analysis
A Book

by Vilijandas Bagdonavičius,Mikhail Stepanovich Nikulin,Queen's University (Kingston, Ont.)

  • Publisher : Kingston, Ont. : Queen's University
  • Release : 1998
  • Pages : 109
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Annual Technical Conference Transactions

Annual Technical Conference Transactions
A Book

by American Society for Quality Control,American Society for Quality Control. Technical Conference

  • Publisher : Unknown Publisher
  • Release : 1966
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Proceedings

Proceedings
1976 Annual Reliability and Maintainability Symposium, Las Vegas, Nevada USA, 20-22 January, 1976

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1976
  • Pages : 503
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Accelerated Life Testing of One-shot Devices

Accelerated Life Testing of One-shot Devices
Data Collection and Analysis

by Narayanaswamy Balakrishnan,Man Ho Ling,Hon Yiu So

  • Publisher : John Wiley & Sons
  • Release : 2021-03-23
  • Pages : 240
  • ISBN : 1119664004
  • Language : En, Es, Fr & De
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Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.