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Architecture Design for Soft Errors

Architecture Design for Soft Errors
A Book

by Shubu Mukherjee

  • Publisher : Morgan Kaufmann
  • Release : 2011-08-29
  • Pages : 360
  • ISBN : 9780080558325
  • Language : En, Es, Fr & De
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Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors Shows readers how to quantify their soft error reliability Provides state-of-the-art techniques to protect against soft errors

Soft Errors

Soft Errors
From Particles to Circuits

by Jean-Luc Autran,Daniela Munteanu

  • Publisher : CRC Press
  • Release : 2015-02-25
  • Pages : 439
  • ISBN : 146659084X
  • Language : En, Es, Fr & De
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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Soft Error Reliability Using Virtual Platforms

Soft Error Reliability Using Virtual Platforms
Early Evaluation of Multicore Systems

by Felipe Rocha da Rosa,Luciano Ost,Ricardo Reis

  • Publisher : Springer Nature
  • Release : 2020-11-02
  • Pages : 136
  • ISBN : 3030557049
  • Language : En, Es, Fr & De
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This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.

Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems
A Book

by Michael Nicolaidis

  • Publisher : Springer Science & Business Media
  • Release : 2010-09-24
  • Pages : 318
  • ISBN : 9781441969934
  • Language : En, Es, Fr & De
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This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Resilient Architecture Design for Voltage Variation

Resilient Architecture Design for Voltage Variation
A Book

by Vijay Janapa Reddi,Meeta Sharma Gupta

  • Publisher : Morgan & Claypool Publishers
  • Release : 2013-05-01
  • Pages : 138
  • ISBN : 1608456382
  • Language : En, Es, Fr & De
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Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructs that can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency

Soft Error Reliability of VLSI Circuits

Soft Error Reliability of VLSI Circuits
Analysis and Mitigation Techniques

by Behnam Ghavami,Mohsen Raji

  • Publisher : Springer Nature
  • Release : 2020-11-14
  • Pages : 114
  • ISBN : 3030516105
  • Language : En, Es, Fr & De
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This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

FPGAs and Parallel Architectures for Aerospace Applications

FPGAs and Parallel Architectures for Aerospace Applications
Soft Errors and Fault-Tolerant Design

by Fernanda Kastensmidt,Paolo Rech

  • Publisher : Springer
  • Release : 2015-12-07
  • Pages : 325
  • ISBN : 3319143522
  • Language : En, Es, Fr & De
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This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Design of Soft Error Robust High Speed 64-bit Logarithmic Adder

Design of Soft Error Robust High Speed 64-bit Logarithmic Adder
A Book

by Jaspal Singh Shah

  • Publisher : Unknown Publisher
  • Release : 2008
  • Pages : 55
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Continuous scaling of the transistor size and reduction of the operating voltage have led to a significant performance improvement of integrated circuits. However, the vulnerability of the scaled circuits to transient data upsets or soft errors, which are caused by alpha particles and cosmic neutrons, has emerged as a major reliability concern. In this thesis, we have investigated the effects of soft errors in combinational circuits and proposed soft error detection techniques for high speed adders. In particular, we have proposed an area-efficient 64-bit soft error robust logarithmic adder (SRA). The adder employs the carry merge Sklansky adder architecture in which carries are generated every 4 bits. Since the particle-induced transient, which is often referred to as a single event transient (SET) typically lasts for 100~200 ps, the adder uses time redundancy by sampling the sum outputs twice.

Achieving High Availability with Commodity Hardware and Software

Achieving High Availability with Commodity Hardware and Software
A Book

by Nidhi Aggarwal

  • Publisher : Unknown Publisher
  • Release : 2008
  • Pages : 118
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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On-Line Testing Workshop

On-Line Testing Workshop
Proceedings of the Eighth International On-Line Testing Workshop : (IOLTW 2002) : 8-10 July, 2002, Hotel Delos--Isle of Bendor, France

by Anonim

  • Publisher : IEEE
  • Release : 2002
  • Pages : 273
  • ISBN : 9780769516417
  • Language : En, Es, Fr & De
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This text contains information on computer engineering as presented at the 8th IEEE International On-Line Testing Workshop (IOLTW 2002).

Dependable Systems and Networks (DSN 2001) (Formerly FTCS)

Dependable Systems and Networks (DSN 2001) (Formerly FTCS)
2001 International Conference

by IEEE Computer Society,IEEE,PR&&&&

  • Publisher : Institute of Electrical & Electronics Engineers(IEEE)
  • Release : 2001
  • Pages : 590
  • ISBN : 9780769511016
  • Language : En, Es, Fr & De
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Proceedings of a July 2001 conference, covering all aspects of dependability in classical and networked computer systems, as well as topical areas in IT. There is a special focus on safety and security issues in embedded, multimedia, and Internet applications. Papers are in sections on modeling, algorithms, software demos, replication, software robustness, survivability and security, wireless and mobile communications, real-time, testing and runtime error detection, models for fault tolerance, hardware architecture and design, group-oriented systems, and practical experiences. Specific topics include model- based synthesis of fault trees from MATLAB, a dynamic replica selection algorithm for tolerating timing faults, constructing self- testable software components, and intrusion-tolerant group management in enclaves. This volume lacks a subject index. c. Book News Inc.

ISLPED'04

ISLPED'04
Proceedings of the 2004 International Symposium on Low Power Electronics and Design : Newport Beach Marriott Hotel, Newport Beach, California, USA, August 9-11, 2004

by IEEE Circuits and Systems Society

  • Publisher : Institute of Electrical & Electronics Engineers(IEEE)
  • Release : 2004
  • Pages : 400
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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"IEEE Catalog Number: 04TH8758"--T.p. verso.

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
A Book

by C. Metra

  • Publisher : Institute of Electrical & Electronics Engineers(IEEE)
  • Release : 2003
  • Pages : 229
  • ISBN : 9780769519685
  • Language : En, Es, Fr & De
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Exploring Memory Hierarchy Design with Emerging Memory Technologies

Exploring Memory Hierarchy Design with Emerging Memory Technologies
A Book

by Guangyu Sun

  • Publisher : Springer Science & Business Media
  • Release : 2013-09-18
  • Pages : 122
  • ISBN : 3319006819
  • Language : En, Es, Fr & De
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This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the “memory wall.” The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named “Moguls” is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs.

Efficient Techniques for Modeling and Mitigation of Soft Errors in Nanometer-scale Static CMOS Logic Circuits

Efficient Techniques for Modeling and Mitigation of Soft Errors in Nanometer-scale Static CMOS Logic Circuits
A Book

by Srivathsan Krishnamohan

  • Publisher : Unknown Publisher
  • Release : 2005
  • Pages : 250
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Electronic Design

Electronic Design
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1984
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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ACM SIGPLAN Notices

ACM SIGPLAN Notices
A Monthly Publication of the Special Interest Group on Programming Languages

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2006-07
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Dissertation Abstracts International

Dissertation Abstracts International
The sciences and engineering. B

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2008
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Proceedings

Proceedings
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2005
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Integrated Circuit and System Design

Integrated Circuit and System Design
Power and Timing Modeling, Optimization and Simulation : ... International Workshop, PATMOS ... : Proceedings

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2004
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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