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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
A Book

by Giovanni Agostini,Carlo Lamberti

  • Publisher : Newnes
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 044459549X
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling. The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology. Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 1. Introduction: The Interdisciplinary Nature of and Nanotechnology and Its Need to Exploit Frontier Characterization Techniques

by Giovanni Agostini,Carlo Lamberti

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083344
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 15. Electrical and Electro-Optical Characterization of Semiconductor Nanowires

by Lorenzo Rigutti,Maria Tchernycheva

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083484
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 12. Photoluminescence Characterization of Structural and Electronic Properties of Semiconductor Quantum Wells

by S. Sanguinetti,M. Guzzi,E. Gatti,M. Gurioli

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 012808345X
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 3. Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-Ray Diffraction

by Claudio Ferrari,Elisa Buffagni,Francesca Rossi

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083360
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 6. Local Structure of Bulk and Nanocrystalline Semiconductors Using Total Scattering Methods

by Emil S. Božin,Pavol Juhás,Simon J.L. Billinge

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083395
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 16. Electron Spin Resonance of Interfaces and Nanolayers in Semiconductor Heterostructures

by Andre Stesmans,Valery V. Afanas’ev

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083492
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 14. The Role of Photoemission Spectroscopies in Heterojunction Research

by G. Margaritondo

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083476
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 5. Small-Angle X-Ray Scattering for the Study of Nanostructures and Nanostructured Materials

by Giuseppe Portale,Alessandro Longo

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083387
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 13. Cathodoluminescence of Self-assembled Nanosystems: The Cases of Tetrapods, Nanowires, and Nanocrystals

by Giancarlo Salviati,Filippo Fabbri,Francesca Detto,Francesca Rossi,Laura Lazzarini,Takashi Sekiguchi

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083468
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 2. Ab initio Studies of Structural and Electronic Properties

by Maria Peressi,Alfonso Baldereschi

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083352
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 7. X-Ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures

by F. Boscherini

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083409
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 10. Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures

by Laura Lazzarini,Lucia Nasi,Vincenzo Grillo

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083433
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 4. Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams

by Tobias Schülli,Vincent Favre-Nicolin,Marie-Ingrid Richard,Gilles Renaud

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083379
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 11. Imaging at the Nanoscale: Scanning Probe Microscopies Applied to Semiconductors

by Chiara Manfredotti

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083441
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 8. Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures

by H. Renevier,M.G. Proietti

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083417
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
A Book

by Giovanni Agostini,Carlo Lamberti

  • Publisher : Elsevier
  • Release : 2011-08-11
  • Pages : 496
  • ISBN : 9780080558158
  • Language : En, Es, Fr & De
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In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. - Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures - Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field - Each chapter starts with a didactic introduction on the technique - The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors

Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 17. Raman Spectroscopy

by Daniel Wolverson

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083506
  • Language : En, Es, Fr & De
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures
Chapter 9. Micro- and Nano-X-ray Beams

by Gema Martinez-Criado,Elisa Borfecchia,Lorenzo Mino,Carlo Lamberti

  • Publisher : Elsevier Inc. Chapters
  • Release : 2013-04-11
  • Pages : 828
  • ISBN : 0128083425
  • Language : En, Es, Fr & De
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Design and Realization of Novel GaAs Based Laser Concepts

Design and Realization of Novel GaAs Based Laser Concepts
A Book

by Tim David Germann

  • Publisher : Springer Science & Business Media
  • Release : 2013-02-26
  • Pages : 150
  • ISBN : 3642340792
  • Language : En, Es, Fr & De
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Semiconductor heterostructures represent the backbone for an increasing variety of electronic and photonic devices, for applications including information storage, communication and material treatment, to name but a few. Novel structural and material concepts are needed in order to further push the performance limits of present devices and to open up new application areas. This thesis demonstrates how key performance characteristics of three completely different types of semiconductor lasers can be tailored using clever nanostructure design and epitaxial growth techniques. All aspects of laser fabrication are discussed, from design and growth of nanostructures using metal-organic vapor-phase epitaxy, to fabrication and characterization of complete devices.