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ESD Protection Methodologies

ESD Protection Methodologies
From Component to System

by Marise Bafleur,Fabrice Caignet,Nicolas Nolhier

  • Publisher : Elsevier
  • Release : 2017-07-26
  • Pages : 284
  • ISBN : 0081011601
  • Language : En, Es, Fr & De
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Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level. Provides a global ESD protection approach from component to system, including both the proposal of investigation techniques and predictive simulation methodologies Addresses circuit and system designers as well as failure analysis engineers Provides the description of specifically developed investigation techniques and the application of the proposed methodologies to real case studies

Simulation Methods for ESD Protection Development

Simulation Methods for ESD Protection Development
A Book

by Harald Gossner,Kai Esmark,Wolfgang Stadler

  • Publisher : Elsevier
  • Release : 2003-10-16
  • Pages : 304
  • ISBN : 9780080526478
  • Language : En, Es, Fr & De
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Simulation Methods for ESD Protection Development looks at the integration of new techniques into a comprehensive development flow, which is now available due advances made in the field during the recent years. These findings allow for an early, stable ESD concept at a very early stage of the technology development, which is essential now development cycles have been reduced. The book also offers ways of increasing the optimization and control of the technology concerning performance, thus making the process more cost effective and increasingly efficient. This title provides a guide through the latest research and technology presenting the ESD protection development methodology. This is based on a combination of process, device and circuit stimulation, and addresses the optimization of the industry critical issue, reduced development cycles.Written to address the needs of the ESD engineer, this text is required reading by all industry practitioners and researchers and students within this field. The FIRST Extensive overview on the subject of ESD simulation Addresses the industry critical issue of reduced development cycles, and provides solutions Presents the latest research in the field with high practical relevance and its results

System Level ESD Protection

System Level ESD Protection
A Book

by Vladislav Vashchenko,Mirko Scholz

  • Publisher : Springer Science & Business Media
  • Release : 2014-03-21
  • Pages : 320
  • ISBN : 3319032216
  • Language : En, Es, Fr & De
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This book addresses key aspects of analog integrated circuits and systems design related to system level electrostatic discharge (ESD) protection. It is an invaluable reference for anyone developing systems-on-chip (SoC) and systems-on-package (SoP), integrated with system-level ESD protection. The book focuses on both the design of semiconductor integrated circuit (IC) components with embedded, on-chip system level protection and IC-system co-design. The readers will be enabled to bring the system level ESD protection solutions to the level of integrated circuits, thereby reducing or completely eliminating the need for additional, discrete components on the printed circuit board (PCB) and meeting system-level ESD requirements. The authors take a systematic approach, based on IC-system ESD protection co-design. A detailed description of the available IC-level ESD testing methods is provided, together with a discussion of the correlation between IC-level and system-level ESD testing methods. The IC-level ESD protection design is demonstrated with representative case studies which are analyzed with various numerical simulations and ESD testing. The overall methodology for IC-system ESD co-design is presented as a step-by-step procedure that involves both ESD testing and numerical simulations.

Simulation Methods for ESD Protection Development

Simulation Methods for ESD Protection Development
A Book

by Kai Esmark,Harald Gossner,Wolfgang Stadler

  • Publisher : Elsevier Science Limited
  • Release : 2003
  • Pages : 291
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Simulation Methods for ESD Protection Development looks at the integration of new techniques into a comprehensive development flow, which is now available due advances made in the field during the recent years. These findings allow for an early, stable ESD concept at a very early stage of the technology development, which is essential now development cycles have been reduced. The book also offers ways of increasing the optimization and control of the technology concerning performance, thus making the process more cost effective and increasingly efficient. This title provides a guide through the latest research and technology presenting the ESD protection development methodology. This is based on a combination of process, device and circuit stimulation, and addresses the optimization of the industry critical issue, reduced development cycles.Written to address the needs of the ESD engineer, this text is required reading by all industry practitioners and researchers and students within this field. The FIRST Extensive overview on the subject of ESD simulation Addresses the industry critical issue of reduced development cycles, and provides solutions Presents the latest research in the field with high practical relevance and its results

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

ESD Protection Device and Circuit Design for Advanced CMOS Technologies
A Book

by Oleg Semenov,Hossein Sarbishaei,Manoj Sachdev

  • Publisher : Springer Science & Business Media
  • Release : 2008-04-26
  • Pages : 228
  • ISBN : 9781402083013
  • Language : En, Es, Fr & De
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ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

On-Chip ESD Protection for Integrated Circuits

On-Chip ESD Protection for Integrated Circuits
An IC Design Perspective

by Albert Z.H. Wang

  • Publisher : Springer Science & Business Media
  • Release : 2006-04-18
  • Pages : 303
  • ISBN : 0306476185
  • Language : En, Es, Fr & De
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This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including: Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc. ESD failure analysis, protection devices, and protection of sub-circuits Whole-chip ESD protection and ESD-to-circuit interactions Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more! Many real world ESD protection circuit design examples are provided. The book can be used as a reference book for working IC designers and as a textbook for students in the IC design field.

ESD in Silicon Integrated Circuits

ESD in Silicon Integrated Circuits
A Book

by E. Ajith Amerasekera,Charvaka Duvvury,Warren Anderson,Horst Gieser,Sridhar Ramaswamy

  • Publisher : Wiley-Blackwell
  • Release : 2002-05-22
  • Pages : 412
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.

Electrostatic Discharge Protection

Electrostatic Discharge Protection
Advances and Applications

by Juin J. Liou

  • Publisher : CRC Press
  • Release : 2017-12-19
  • Pages : 304
  • ISBN : 1482255898
  • Language : En, Es, Fr & De
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Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.

Electrostatic Discharge Protection

Electrostatic Discharge Protection
Advances and Applications

by Juin J. Liou

  • Publisher : CRC Press
  • Release : 2017-12-19
  • Pages : 304
  • ISBN : 1482255898
  • Language : En, Es, Fr & De
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Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.

Basic ESD and I/O Design

Basic ESD and I/O Design
A Book

by Sanjay Dabral,Timothy Maloney

  • Publisher : Wiley-Interscience
  • Release : 1998
  • Pages : 305
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve.

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
A Book

by Qiang Cui,Juin J. Liou,Jean-Jacques Hajjar,Javier Salcedo,Yuanzhong Zhou,Parthasarathy Srivatsan

  • Publisher : Springer
  • Release : 2015-03-10
  • Pages : 86
  • ISBN : 3319108190
  • Language : En, Es, Fr & De
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This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.

System Level ESD Co-Design

System Level ESD Co-Design
A Book

by Charvaka Duvvury,Harald Gossner

  • Publisher : John Wiley & Sons
  • Release : 2015-08-04
  • Pages : 424
  • ISBN : 1118861841
  • Language : En, Es, Fr & De
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An effective and cost efficient protection of electronic system against ESD stress pulses specified by IEC 61000-4-2 is paramount for any system design. This pioneering book presents the collective knowledge of system designers and system testing experts and state-of-the-art techniques for achieving efficient system-level ESD protection, with minimum impact on the system performance. All categories of system failures ranging from 'hard' to 'soft' types are considered to review simulation and tool applications that can be used. The principal focus of System Level ESD Co-Design is defining and establishing the importance of co-design efforts from both IC supplier and system builder perspectives. ESD designers often face challenges in meeting customers' system-level ESD requirements and, therefore, a clear understanding of the techniques presented here will facilitate effective simulation approaches leading to better solutions without compromising system performance. With contributions from Robert Ashton, Jeffrey Dunnihoo, Micheal Hopkins, Pratik Maheshwari, David Pomerenke, Wolfgang Reinprecht, and Matti Usumaki, readers benefit from hands-on experience and in-depth knowledge in topics ranging from ESD design and the physics of system ESD phenomena to tools and techniques to address soft failures and strategies to design ESD-robust systems that include mobile and automotive applications. The first dedicated resource to system-level ESD co-design, this is an essential reference for industry ESD designers, system builders, IC suppliers and customers and also Original Equipment Manufacturers (OEMs). Key features: Clarifies the concept of system level ESD protection. Introduces a co-design approach for ESD robust systems. Details soft and hard ESD fail mechanisms. Detailed protection strategies for both mobile and automotive applications. Explains simulation tools and methodology for system level ESD co-design and overviews available test methods and standards. Highlights economic benefits of system ESD co-design.

Digital Systems

Digital Systems
A Book

by Vahid Asadpour

  • Publisher : BoD – Books on Demand
  • Release : 2018-11-28
  • Pages : 164
  • ISBN : 1789845408
  • Language : En, Es, Fr & De
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This book provides an approach toward the applications and principle theory of digital signal processing in modern intelligent systems, biological engineering, telecommunication, and information technology. Assuming the reader already has prior knowledge of signal processing theory, this book will be useful for finding novel methods that fit special needs in digital signal processing (DSP). The combination of signal processing and intelligent systems in hybrid structures rather than serial or parallel processing provide the best mechanism that is a better fit with the comprehensive nature of human. This book is a practical reference that places the emphasis on principles and applications of DSP in digital systems. It covers a broad area of digital systems and applications of machine learning methods including convolutional neural networks, evolutionary algorithms, adaptive filters, spectral estimation, data compression and functional verification. The level of the book is ideal for professional DSP users and useful for graduate students who are looking for solutions to their design problems. The theoretical principles provide the required base for comprehension of the methods and application of modifications for the special needs of practical projects.

ESD

ESD
Design and Synthesis

by Steven H. Voldman

  • Publisher : John Wiley & Sons
  • Release : 2011-04-04
  • Pages : 290
  • ISBN : 1119992656
  • Language : En, Es, Fr & De
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Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist perspective, followed by examples in specific technologies, circuits, and chips. Uniquely both the semiconductor chip integration issues and floorplanning of ESD networks are covered from a ‘top-down' design approach. Look inside for extensive coverage on: integration of cores, power bussing, and signal pins in DRAM, SRAM, CMOS image processing chips, microprocessors, analog products, RF components and how the integration influences ESD design and integration architecturing of mixed voltage, mixed signal, to RF design for ESD analysis floorplanning for peripheral and core I/O designs, and the implications on ESD and latchup guard ring integration for both a ‘bottom-up' and ‘top-down' methodology addressing I/O guard rings, ESD guard rings, I/O to I/O, and I/O to core classification of ESD power clamps and ESD signal pin circuitry, and how to make the correct choice for a given semiconductor chip examples of ESD design for the state-of-the-art technologies discussed, including CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, and smart power practical methods for the understanding of ESD circuit power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics ESD: Design and Synthesis is a continuation of the author's series of books on ESD protection. It is an essential reference for: ESD, circuit, and semiconductor engineers; design synthesis team leaders; layout design, characterisation, floorplanning, test and reliability engineers; technicians; and groundrule and test site developers in the manufacturing and design of semiconductor chips. It is also useful for graduate and undergraduate students in electrical engineering, semiconductor sciences, and manufacturing sciences, and on courses involving the design of ESD devices, chips and systems. This book offers a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

ESD Design and Analysis Handbook

ESD Design and Analysis Handbook
A Book

by James E. Vinson,Joseph C. Bernier,Gregg D. Croft,Juin Jei Liou

  • Publisher : Springer Science & Business Media
  • Release : 2003
  • Pages : 207
  • ISBN : 9781402073502
  • Language : En, Es, Fr & De
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Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.

LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receivers

LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receivers
A Book

by Paul Leroux,Michiel Steyaert

  • Publisher : Springer Science & Business Media
  • Release : 2005-11-07
  • Pages : 187
  • ISBN : 9781402031908
  • Language : En, Es, Fr & De
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LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receivers fits in the quest for complete CMOS integration of wireless receiver front-ends. With a combined discussion of both RF and ESD performance, it tackles one of the final obstacles on the road to CMOS integration. The book is conceived as a design guide for those actively involved in the design of CMOS wireless receivers. The book starts with a comprehensive introduction to the performance requirements of low-noise amplifiers in wireless receivers. Several popular topologies are explained and compared with respect to future technology and frequency scaling. The ESD requirements are introduced and related to the state-of-the-art protection devices and circuits. LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receivers provides an extensive theoretical treatment of the performance of CMOS low-noise amplifiers in the presence of ESD-protection circuitry. The influence of the ESD-protection parasitics on noise figure, gain, linearity, and matching are investigated. Several RF-ESD co-design solutions are discussed allowing both high RF-performance and good ESD-immunity for frequencies up to and beyond 5 GHz. Special attention is also paid to the layout of both active and passive components. LNA-ESD Co-Design for Fully Integrated CMOS Wireless Receivers offers the reader intuitive insight in the LNA’s behavior, as well as the necessary mathematical background to optimize its performance. All material is experimentally verified with several CMOS implementations, among which a fully integrated GPS receiver front-end. The book is essential reading for RF design engineers and researchers in the field and is also suitable as a text book for an advanced course on the subject.

ESD Design for Analog Circuits

ESD Design for Analog Circuits
A Book

by Vladislav A. Vashchenko,Andrei Shibkov

  • Publisher : Springer Science & Business Media
  • Release : 2010-07-27
  • Pages : 459
  • ISBN : 9781441965653
  • Language : En, Es, Fr & De
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This Book and Simulation Software Bundle Project Dear Reader, this book project brings to you a unique study tool for ESD protection solutions used in analog-integrated circuit (IC) design. Quick-start learning is combined with in-depth understanding for the whole spectrum of cro- disciplinary knowledge required to excel in the ESD ?eld. The chapters cover technical material from elementary semiconductor structure and device levels up to complex analog circuit design examples and case studies. The book project provides two different options for learning the material. The printed material can be studied as any regular technical textbook. At the same time, another option adds parallel exercise using the trial version of a complementary commercial simulation tool with prepared simulation examples. Combination of the textbook material with numerical simulation experience presents a unique opportunity to gain a level of expertise that is hard to achieve otherwise. The book is bundled with simpli?ed trial version of commercial mixed- TM mode simulation software from Angstrom Design Automation. The DECIMM (Device Circuit Mixed-Mode) simulator tool and complementary to the book s- ulation examples can be downloaded from www.analogesd.com. The simulation examples prepared by the authors support the speci?c examples discussed across the book chapters. A key idea behind this project is to provide an opportunity to not only study the book material but also gain a much deeper understanding of the subject by direct experience through practical simulation examples.

ESD

ESD
RF Technology and Circuits

by Steven H. Voldman

  • Publisher : John Wiley & Sons
  • Release : 2006-11-02
  • Pages : 420
  • ISBN : 0470061391
  • Language : En, Es, Fr & De
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With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD. ESD: RF Technology and Circuits: Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips; discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting; examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology; gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems; highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry; sets out examples of RF ESD design computer aided design methodologies; covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts. Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.

TVS Transient Behavior Modeling Method, and System-level Effective ESD Design for USB3.X Interface

TVS Transient Behavior Modeling Method, and System-level Effective ESD Design for USB3.X Interface
A Book

by Pengyu Wei

  • Publisher : Unknown Publisher
  • Release : 2018
  • Pages : 75
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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"This research proposal presents a methodology whereby a protection device can be modeled in SPICE compatible platforms with respect to the transient behaviors during Electrostatic Discharge (ESD) events. This methodology uses an exclusively "black-box" approach to characterize the parameters of the protection device, thereby allowing it to be implemented without intimate knowledge of the DUT. Results of this methodology can be used to predict the transient response (conductivity modulation and snapback delay) of the ESD protection devices, and thereby predicts how much current could flow into the device (typically a digital IO pin) under protection. The transient behavior modeling methodology for the ESD protection device is developed for the purpose of system level ESD design, and it is part of the study of System-level Effective ESD Design (SEED) methodology. During the work, the transient behavior modeling method and the SEED methodology have been applied to a high-speed USB3.x repeater IC circuit design. This article introduces a PCB test board working as USB3.x repeater, which allows to place various on-board protection devices and to measure the residual voltage and current at the IO pin accurately. In Section 2, the transient behavior modeling framework and the characterization method will be introduced. The validation results of three different types of protection devices are shown in the end of the section. In Section 3, the implementation of SEED methodology to a USB3.x system design will be introduced. The measurement setup is described in detail. Finally, the validation results for different scenarios will be shown"--Abstract, page iii.

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2005
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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