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Reliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices
A Book

by Robert Herrick,Osamu Ueda

  • Publisher : Woodhead Publishing
  • Release : 2021-03-06
  • Pages : 334
  • ISBN : 0128192550
  • Language : En, Es, Fr & De
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Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies. This book is suitable for new entrants to the field of optoelectronics working in R&D. • Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry • Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products. • Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more.

Reliability and Degradation of Semiconductor Lasers and LEDs

Reliability and Degradation of Semiconductor Lasers and LEDs
A Book

by Mitsuo Fukuda

  • Publisher : Artech House on Demand
  • Release : 1991-01-01
  • Pages : 343
  • ISBN : 9780890064658
  • Language : En, Es, Fr & De
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This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.

Optical Semiconductor Devices

Optical Semiconductor Devices
A Book

by Mitsuo Fukuda

  • Publisher : John Wiley & Sons
  • Release : 1998-12-24
  • Pages : 440
  • ISBN : 9780471149590
  • Language : En, Es, Fr & De
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This book is devoted to optical semiconductor devices and their numerous applications in telecommunications, optoelectronics, and consumer electronics-areas where signal processing or the transmission of signals across fiber optic cables is paramount. It introduces a new generation of devices that includes optical modulators, quantum well (QW) lasers, and photodiodes and explores new applications of more established devices such as semiconductor lasers, light-emitting diodes, and photodiodes. Mitsuo Fukuda examines the material properties, operation principles, fabrication, packaging, reliability, and applications of each device and offers a unique industrial perspective, discussing everything engineers and scientists need to know at different phases of research, development, and production. This guide to the state-of-the-art of optical semiconductor devices: * Helps you choose the right device for a given application. * Covers important performance data such as temperature and optical feedback noise in lasers. * Highlights epitaxial growth techniques and fabrication for each device. * Features one hundred figures and an extensive bibliography. * Provides a clear and concise treatment, unencumbered by excessive theory Optical Semiconductor Devices is an essential resource for engineers and researchers in telecommunications and optoelectronics, equipment designers and manufacturers, and graduate students and scholars interested in this rapidly evolving field.

Semiconductor Laser Engineering, Reliability and Diagnostics

Semiconductor Laser Engineering, Reliability and Diagnostics
A Practical Approach to High Power and Single Mode Devices

by Peter W. Epperlein

  • Publisher : John Wiley & Sons
  • Release : 2013-03-18
  • Pages : 522
  • ISBN : 1119990335
  • Language : En, Es, Fr & De
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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices”. By Peter W. Epperlein Prof. em. Dr. Heinz Jäckel, High Speed Electronics and Photonics, Swiss Federal Institute of Technology ETH Zürich, Switzerland The book “Semiconductor Laser Engineering, Reliability and Diagnostics” by Dr. P.W. Epperlein is a landmark in the recent literature on semiconductor lasers because it fills a longstanding gap between many excellent books on laser theory and the complex and challenging endeavor to fabricate these devices reproducibly and reliably in an industrial, real world environment. Having worked myself in the early research and development of high power semiconductor lasers, I appreciate the competent, complete and skillful presentation of these three highly interrelated topics, where small effects have dramatic consequences on the success of a final product, on the ultimate performance and on the stringent reliability requirements, which are the name of the game. As the title suggests the author addresses three tightly interwoven and critical topics of state-of-the-art power laser research. The three parts are: device and mode stability engineering (chapter 1, 2), reliability mechanisms and reliability assessment strategies (chapter 3, 4, 5, 6) and finally material and device diagnostics (chapter 7, 8, 9) all treated with a strong focus on the implementation. This emphasis on the complex practical aspects for a large-scale power laser fabrication is a true highlight of the book. The subtle interplay between laser design, reliability strategies, advanced failure analysis and characterization techniques are elaborated in a very rigorous and scientific way using a very clear and easy to read representation of the complex interrelation of the three major topics. I will abstain from trying to provide a complete account of all the topics but mainly concentrate on the numerous highlights. The first part 1 “Laser Engineering” is divided in two chapters on basic electronic-optical, structural, material and resonator laser engineering on the one side, and on single mode control and stability at very high, still reliable power-levels with the trade-off between mirror damage, single mode stability on the other side. To round up the picture less well-known concepts and the state-of-the-art of large-area lasers, which can be forced into single-mode operation, are reviewed carefully. The subtle and complex interplay, which is challenging to optimize for a design for reliability and low stress as a major boundary condition is crucial for the design. The section gives a rather complete and well-referenced account of all relevant aspects, relations and trade-offs for understanding the rest of the book. The completeness of the presentation on power laser diode design based on basic physical and plausible arguments is mainly based on analytic mathematical relations as well as experiments providing a new and well-balanced addition for the power diode laser literature in particular. Modern 2D self-consistent electro-optical laser modeling including carrier hole burning and thermal effects – this is important because the weak optical guiding and gain-discrimination

Semiconductor Optoelectronic Device Manufacturing and Applications

Semiconductor Optoelectronic Device Manufacturing and Applications
7-9 November 2001, Nanjing, China

by David Chen,Society of Photo-optical Instrumentation Engineers

  • Publisher : Society of Photo Optical
  • Release : 2001
  • Pages : 352
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Fabrication, Testing, and Reliability of Semiconductor Lasers

Fabrication, Testing, and Reliability of Semiconductor Lasers
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1997
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1984
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Packaging of High Power Semiconductor Lasers

Packaging of High Power Semiconductor Lasers
A Book

by Xingsheng Liu,Wei Zhao,Lingling Xiong,Hui Liu

  • Publisher : Springer
  • Release : 2014-07-14
  • Pages : 402
  • ISBN : 1461492637
  • Language : En, Es, Fr & De
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This book introduces high power semiconductor laser packaging design. The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in detail.

Reliability and Radiation Effects in Compound Semiconductors

Reliability and Radiation Effects in Compound Semiconductors
A Book

by Allan Johnston

  • Publisher : World Scientific
  • Release : 2010
  • Pages : 376
  • ISBN : 9814277118
  • Language : En, Es, Fr & De
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This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

Nitride Semiconductor Technology

Nitride Semiconductor Technology
Power Electronics and Optoelectronic Devices

by Fabrizio Roccaforte,Michael Leszczynski

  • Publisher : John Wiley & Sons
  • Release : 2020-07-30
  • Pages : 464
  • ISBN : 3527825274
  • Language : En, Es, Fr & De
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Groundbreaking book that combines information on power electronics and optoelectronic applications of nitride semiconductors With contributions from a panel of international experts, Nitride Semiconductor Technology: Power Electronics and Optoelectronic Devices offers a state-of-the-art review of GaN-based technologies that covers the fields of both power electronics and optoelectronic devices. The authors present detailed explanations of the physical properties of materials and their growth methods. They also include information on GaN-based technology applications in high electron mobility transistors, vertical power devices, LEDs, laser diodes, and vertical-cavity surface-emitting lasers. Nitride Semiconductor Technology contains an in-depth examination of reliability issues with the materials and offers advice on integrating them with 2D materials for novel high-frequency and high-power devices. The book also contains a review of the most recent advances in the field. This important book: Presents an in-depth overview of properties, growth techniques, and applicability of nitride semiconductors Offers a one-stop resource that covers nitride semiconductor technology from materials to devices Reviews a widerange of nitride semiconductor applications in high-power and high-frequency devices Written for materials scientists, semiconductor physicists, semiconductor industry professionals, electrical engineers, and electrotechnical industry professionals, Nitride Semiconductor Technology: Power Electronics and Optoelectronic Devices combines the most recent information on power electronics and optoelectronic applications of nitride semiconductors.

Physics Briefs

Physics Briefs
Physikalische Berichte

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1993
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Physics and Simulation of Optoelectronic Devices

Physics and Simulation of Optoelectronic Devices
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2007
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Fiber Optics Reliability and Testing

Fiber Optics Reliability and Testing
Proceedings of a Conference Held 8-9 September 1993, Boston, Mass

by Dilip K. Paul

  • Publisher : SPIE-International Society for Optical Engineering
  • Release : 1994
  • Pages : 262
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Introduction to Semiconductor Lasers for Optical Communications

Introduction to Semiconductor Lasers for Optical Communications
An Applied Approach

by David J. Klotzkin

  • Publisher : Springer Science & Business Media
  • Release : 2013-11-30
  • Pages : 285
  • ISBN : 1461493412
  • Language : En, Es, Fr & De
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This textbook provides a thorough and accessible treatment of semiconductor lasers from a design and engineering perspective. It includes both the physics of devices as well as the engineering, designing and testing of practical lasers. The material is presented clearly with many examples provided. Readers of the book will come to understand the finer aspects of the theory, design, fabrication and test of these devices and have an excellent background for further study of optoelectronics. This book also: Provides a multi-faceted approach to explaining the theories behind semiconductor lasers, utilizing mathematical examples, illustrations and written theoretical presentations Offers a balance of relevant optoelectronic topics, with specific attention given to distributed feedback lasers, growth techniques and waveguide cavity design Provides a summary of every chapter, worked examples, and problems for readers to solve Incorporates and explains recent breakthroughs in laser design

Materials for Optoelectronic Devices, OEICs and Photonics

Materials for Optoelectronic Devices, OEICs and Photonics
Proceedings of Symposium A on Semiconductor Materials for Optoelectronic Devices and OEICs and Symposium B on Nonlinear Optical Materials for Optoelectronics and Integrated Optics of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990

by Heinrich Schlötterer

  • Publisher : North Holland
  • Release : 1991
  • Pages : 527
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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The aim of the contributions in this volume is to give a current overview on the basic properties and applications of semiconductor and nonlinear optical materials for optoelectronics and integrated optics. They provide a cross-linkage between different materials (III-V, II-VI, Si-Ge, glasses, etc.), various sample dimensions (from bulk crystals to quantum dots), and a range of techniques for growth (LPE to MOMBE) and for processing (from surface passivation to ion beams). Major growth techniques and materials are discussed, including the sophisticated technologies required to exploit the exciting properties of low dimensional semiconductors. These proceedings will prove an invaluable guide to the current state of optoelectronic and nonlinear optical materials development, as well as indicating trends and also future markets for optoelectronic devices.

Semiconductor Lasers and Laser Dynamics

Semiconductor Lasers and Laser Dynamics
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2004
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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LEOS '93 Conference Proceedings

LEOS '93 Conference Proceedings
IEEE Lasers and Electro-Optics Society 1993 Annual Meeting, November 15-18, 1993, San Jose Convention Center, San Jose, CA, Co-located with OPTCON '93

by IEEE Lasers and Electro-Optics Society,Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers). Meeting

  • Publisher : Institute of Electrical & Electronics Engineers(IEEE)
  • Release : 1993
  • Pages : 832
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Design & Reliability of Solders and Solder Interconnections

Design & Reliability of Solders and Solder Interconnections
Proceedings of a Symposium Held During the TMS Annual Meeting at Orlando, Florida, February 10-13, 1997

by Rao K. Mahidhara

  • Publisher : Tms
  • Release : 1997
  • Pages : 448
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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The reliability of solders and solder joints is an important factor in the durability and design of electronic packages. This volume addresses issues of reliability such as microstructural stability in service, creep, fatigue, creep/fatigue interactions, and thermomechanical fatigue of bulk solders and solder joints.

Compound Semiconductor

Compound Semiconductor
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2001
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Photonic Materials, Devices and Reliability

Photonic Materials, Devices and Reliability
A Book

by Aris Christou

  • Publisher : RIAC
  • Release : 2006-01-01
  • Pages : 329
  • ISBN : 1933904046
  • Language : En, Es, Fr & De
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