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Reliability, Robustness and Failure Mechanisms of LED Devices

Reliability, Robustness and Failure Mechanisms of LED Devices
Methodology and Evaluation

by Yannick Deshayes,Laurent Bechou

  • Publisher : Elsevier
  • Release : 2017-03-27
  • Pages : 172
  • ISBN : 0081010885
  • Language : En, Es, Fr & De
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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Reliability, Robustness and Failure Mechanisms of Led Devices

Reliability, Robustness and Failure Mechanisms of Led Devices
Methodology and Evaluation

by Yannick Deshayes,Laurent Bchou

  • Publisher : Iste Press - Elsevier
  • Release : 2016-10-01
  • Pages : 200
  • ISBN : 9781785481529
  • Language : En, Es, Fr & De
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"Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation" presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDsIdentifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applicationsUses a complete methodology to reduce the number of samples needed to estimate lifetime distributionFocuses on the method to extract fundamental parameters from electrical and optical characterizations"

Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications
A Book

by Raphael Baillot,Yannick Deshayes

  • Publisher : Elsevier
  • Release : 2017-03-09
  • Pages : 222
  • ISBN : 0081010923
  • Language : En, Es, Fr & De
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Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. Based on the work of two main Phd results in 2011 and 2014 Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model Proposes the technology and methodologies to understand failure mechanisms

Nitride Semiconductor Light-Emitting Diodes (LEDs)

Nitride Semiconductor Light-Emitting Diodes (LEDs)
Materials, Technologies, and Applications

by Jian-Jang Huang,Hao-Chung Kuo,Shyh-Chiang Shen

  • Publisher : Woodhead Publishing
  • Release : 2017-10-24
  • Pages : 822
  • ISBN : 0081019432
  • Language : En, Es, Fr & De
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Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications, Second Edition reviews the fabrication, performance and applications of the technology, encompassing the state-of-the-art material and device development, along with considerations regarding nitride-based LED design. This updated edition is based on the latest research and advances, including two new chapters on LEDs for large displays and laser lighting. Chapters cover molecular beam epitaxy (MBE) growth of nitride semiconductors, modern metalorganic chemical vapor deposition (MOCVD) techniques, the growth of nitride-based materials, and gallium nitride (GaN)-on-sapphire and GaN-on-silicon technologies for LEDs. Nanostructured, non-polar and semi-polar nitride-based LEDs, as well as phosphor-coated nitride LEDs, are also discussed. The book also addresses the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots. Further chapters discuss the development of LED encapsulation technology and fundamental efficiency droop issues in gallium indium nitride (GaInN) LEDs. It is a technical resource for academics, physicists, materials scientists, electrical engineers, and those working in the lighting, consumer electronics, automotive, aviation, and communications sectors. Features new chapters on laser lighting, addressing the latest advances on this topic Reviews fabrication, performance, and applications of this technology that encompass the state-of-the-art material and device development Covers the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots Highlights applications of nitride LEDs, including liquid crystal display (LCD) backlighting, infra-red emitters, and automotive lighting Provides a comprehensive discussion of gallium nitride on both silicon and sapphire substrates

Solid State Lighting Reliability Part 2

Solid State Lighting Reliability Part 2
Components to Systems

by Willem Dirk van Driel,Xuejun Fan,Guo Qi Zhang

  • Publisher : Springer
  • Release : 2017-07-11
  • Pages : 606
  • ISBN : 3319581759
  • Language : En, Es, Fr & De
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In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new and unknown failure modes have also been presented. In this book, Solid State Lighting Reliability Part 2, we invited the experts from industry and academia to present the latest developments and findings in the LED system reliability arena. Topics in this book cover the early failures and critical steps in LED manufacturing; advances in reliability testing and standards; quality of colour and colour stability; degradation of optical materials and the associated chromaticity maintenance; characterization of thermal interfaces; LED solder joint testing and prediction; common failure modes in LED drivers; root causes for lumen depreciation; corrosion sensitivity of LED packages; reliability management for automotive LEDs, and lightning effects on LEDs. This book is a continuation of Solid State Lighting Reliability: Components to Systems (published in 2013), which covers reliability aspects ranging from the LED to the total luminaire or system of luminaires. Together, these two books are a full set of reference books for Solid State Lighting reliability from the performance of the (sub-) components to the total system, regardless its complexity.

Solid State Lighting Reliability

Solid State Lighting Reliability
Components to Systems

by W.D. van Driel,X.J. Fan

  • Publisher : Springer Science & Business Media
  • Release : 2012-09-06
  • Pages : 618
  • ISBN : 1461430674
  • Language : En, Es, Fr & De
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Solid State Lighting Reliability: Components to Systems begins with an explanation of the major benefits of solid state lighting (SSL) when compared to conventional lighting systems including but not limited to long useful lifetimes of 50,000 (or more) hours and high efficacy. When designing effective devices that take advantage of SSL capabilities the reliability of internal components (optics, drive electronics, controls, thermal design) take on critical importance. As such a detailed discussion of reliability from performance at the device level to sub components is included as well as the integrated systems of SSL modules, lamps and luminaires including various failure modes, reliability testing and reliability performance. A follow-up, Solid State Lighting Reliability Part 2, was published in 2017.

mm-Wave Silicon Power Amplifiers and Transmitters

mm-Wave Silicon Power Amplifiers and Transmitters
A Book

by Hossein Hashemi,Sanjay Raman

  • Publisher : Cambridge University Press
  • Release : 2016-04-04
  • Pages : 495
  • ISBN : 1107055865
  • Language : En, Es, Fr & De
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Build high-performance, energy-efficient circuits with this cutting-edge guide to designing, modeling, analysing, implementing and testing new mm-wave systems.

Nitride Semiconductor Technology

Nitride Semiconductor Technology
Power Electronics and Optoelectronic Devices

by Fabrizio Roccaforte,Michael Leszczynski

  • Publisher : John Wiley & Sons
  • Release : 2020-07-17
  • Pages : 464
  • ISBN : 3527825258
  • Language : En, Es, Fr & De
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The book "Nitride Semiconductor Technology" provides an overview of nitride semiconductors and their uses in optoelectronics and power electronics devices. It explains the physical properties of those materials as well as their growth methods. Their applications in high electron mobility transistors, vertical power devices, LEDs, laser diodes, and vertical-cavity surface-emitting lasers are discussed in detail. The book further examines reliability issues in these materials and puts forward perspectives of integrating them with 2D materials for novel high-frequency and high-power devices. In summary, it covers nitride semiconductor technology from materials to devices and provides the basis for further research.

Proceedings

Proceedings
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1998
  • Pages : 129
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Embedded Systems

Embedded Systems
A Contemporary Design Tool

by James K. Peckol

  • Publisher : John Wiley & Sons
  • Release : 2019-04-01
  • Pages : 1080
  • ISBN : 1119457491
  • Language : En, Es, Fr & De
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Embedded Systems: A Contemporary Design Tool, Second Edition Embedded systems are one of the foundational elements of today’s evolving and growing computer technology. From operating our cars, managing our smart phones, cleaning our homes, or cooking our meals, the special computers we call embedded systems are quietly and unobtrusively making our lives easier, safer, and more connected. While working in increasingly challenging environments, embedded systems give us the ability to put increasing amounts of capability into ever-smaller and more powerful devices. Embedded Systems: A Contemporary Design Tool, Second Edition introduces you to the theoretical hardware and software foundations of these systems and expands into the areas of signal integrity, system security, low power, and hardware-software co-design. The text builds upon earlier material to show you how to apply reliable, robust solutions to a wide range of applications operating in today’s often challenging environments. Taking the user’s problem and needs as your starting point, you will explore each of the key theoretical and practical issues to consider when designing an application in today’s world. Author James Peckol walks you through the formal hardware and software development process covering: Breaking the problem down into major functional blocks; Planning the digital and software architecture of the system; Utilizing the hardware and software co-design process; Designing the physical world interface to external analog and digital signals; Addressing security issues as an integral part of the design process; Managing signal integrity problems and reducing power demands in contemporary systems; Debugging and testing throughout the design and development cycle; Improving performance. Stressing the importance of security, safety, and reliability in the design and development of embedded systems and providing a balanced treatment of both the hardware and the software aspects, Embedded Systems: A Contemporary Design Tool, Second Edition gives you the tools for creating embedded designs that solve contemporary real-world challenges.

Electrostatic Discharge Protection

Electrostatic Discharge Protection
Advances and Applications

by Juin J. Liou

  • Publisher : CRC Press
  • Release : 2017-12-19
  • Pages : 304
  • ISBN : 1482255898
  • Language : En, Es, Fr & De
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Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.

Reliability of Organic Compounds in Microelectronics and Optoelectronics

Reliability of Organic Compounds in Microelectronics and Optoelectronics
From Physics-of-failure to Physics-of-degradation

by Willem Dirk van Driel,Maryam Yazdan Mehr

  • Publisher : Springer Nature
  • Release : 2022
  • Pages : 129
  • ISBN : 3030815765
  • Language : En, Es, Fr & De
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This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.

Scientific and Technical Aerospace Reports

Scientific and Technical Aerospace Reports
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1982
  • Pages : 129
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

ESD

ESD
Physics and Devices

by Steven H. Voldman

  • Publisher : John Wiley & Sons
  • Release : 2005-12-13
  • Pages : 420
  • ISBN : 0470012900
  • Language : En, Es, Fr & De
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This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. An invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. Also, suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.

Semiconductor Device Reliability

Semiconductor Device Reliability
A Book

by A. Christou,B.A. Unger

  • Publisher : Springer Science & Business Media
  • Release : 2012-12-06
  • Pages : 575
  • ISBN : 9400924828
  • Language : En, Es, Fr & De
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This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.

Organic Electronics

Organic Electronics
Foundations to Applications

by Stephen R. Forrest

  • Publisher : Oxford University Press, USA
  • Release : 2020
  • Pages : 1072
  • ISBN : 0198529724
  • Language : En, Es, Fr & De
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This textbook provides a basic understanding of the principles of the field of organic electronics through to their applications in organic devices. Useful for the student and practitioner, it is both a teaching text and a resource that is a jumping-off point for learning, working and innovating in this rapidly growing field.

Mechanical Support for Heart Failure

Mechanical Support for Heart Failure
Current Solutions and New Technologies

by Jamshid H. Karimov,Kiyotaka Fukamachi,Randall C. Starling

  • Publisher : Springer Nature
  • Release : 2020-09-04
  • Pages : 744
  • ISBN : 3030478092
  • Language : En, Es, Fr & De
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This book provides a comprehensive overview of mechanical circulatory support of the failing heart in adults and children. The book uniquely combines engineering knowledge and the clinician’s perspective into a single resource, while also providing insights into current and future development of mechanical circulatory support technology, such as ventricular assist devices, the total artificial heart and catheter-based technologies for heart failure. Topics featured in this book include: The history of mechanical circulatory device development. Fundamentals of hemodynamics support. Clinical management of mechanical circulatory devices. Surgical implantation techniques. Current limitations of device therapies in advanced heart failure. Advanced and novel devices in the development pipeline. Opportunities for advancement in the field. Mechanical Support for Heart Failure: Current Solutions and New Technologies is a must-have resource for not only physicians, residents, fellows, and medical students in cardiology and cardiac surgery, but also clinical and basic researchers in biomedical engineering with an interest in mechanical circulatory support, heart failure, and new technological applications in medicine.

Humidity and Electronics

Humidity and Electronics
Corrosion Reliability Issues and Preventive Measures

by Rajan Ambat,Kamila Piotrowska

  • Publisher : Woodhead Publishing
  • Release : 2021-12-10
  • Pages : 398
  • ISBN : 0323908543
  • Language : En, Es, Fr & De
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Humidity and Electronics: Corrosion Reliability Issues and Preventive Measures provides comprehensive information on humidity related corrosion reliability issues surrounding electronics and how to tackle potential issues from a pro-active-design-prevention perspective. The book contains a mix of academic and industrial relevance, making it suitable for a detailed understanding on humidity issues on electronics, both for materials and corrosion experts and electronics and electrical experts. It will be useful for researchers, academics, and industrial personals involved in materials, corrosion, and electronics reliability aspects. Provides basic and applied knowledge surrounding corrosion in electronics Combines electronics/electrical and electrochemical aspects related to failure modes and mechanisms Presents knowledge on influencing factors and how they can be used as preventive measures at the material, component, device and system level

Component Reliability for Electronic Systems

Component Reliability for Electronic Systems
A Book

by Titu I. Băjenescu,Marius I. Bâzu

  • Publisher : Artech House
  • Release : 2010
  • Pages : 685
  • ISBN : 1596934360
  • Language : En, Es, Fr & De
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The main reason for the premature breakdown of today's electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. Today professionals are looking for effective ways to minimize the degradation of electronic components to help ensure longer-lasting, more technically sound products and systems. This practical book offers engineers specific guidance on how to design more reliable components and build more reliable electronic systems. Professionals learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for the intended applications. Moreover, the book helps system designers ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure.

Java/Jini Technologies

Java/Jini Technologies
21-22 August 2001, Denver, USA

by Sudipto Ghosh

  • Publisher : Society of Photo Optical
  • Release : 2001
  • Pages : 154
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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