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Reliability, Robustness and Failure Mechanisms of LED Devices

Reliability, Robustness and Failure Mechanisms of LED Devices
Methodology and Evaluation

by Yannick Deshayes,Laurent Bechou

  • Publisher : Elsevier
  • Release : 2017-03-27
  • Pages : 172
  • ISBN : 0081010885
  • Language : En, Es, Fr & De
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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications
A Book

by Raphael Baillot,Yannick Deshayes

  • Publisher : Elsevier
  • Release : 2017-03-09
  • Pages : 222
  • ISBN : 0081010923
  • Language : En, Es, Fr & De
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Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. Based on the work of two main Phd results in 2011 and 2014 Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model Proposes the technology and methodologies to understand failure mechanisms

LED Packaging for Lighting Applications

LED Packaging for Lighting Applications
Design, Manufacturing, and Testing

by Sheng Liu,Xiaobing Luo

  • Publisher : John Wiley & Sons
  • Release : 2011-07-05
  • Pages : 320
  • ISBN : 0470828404
  • Language : En, Es, Fr & De
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Since the first light-emitting diode (LED) was invented by Holonyak and Bevacqua in 1962, LEDs have made remarkable progress in the past few decades with the rapid development of epitaxy growth, chip design and manufacture, packaging structure, processes, and packaging materials. LEDs have superior characteristics such as high efficiency, small size, long life, low power consumption, and high reliability. The market for white LED is growing rapidly in various applications. It has been widely accepted that white LEDs will be the fourth illumination source to substitute the incandescent, fluorescent, and high-pressure sodium lamps. With the development of LED chip and packaging technologies, the efficiency of high power white LED will broaden the application markets of LEDs while changing the lighting concepts of our lives. In LED Packaging for Lighting Applications, Professors Liu and Luo cover the full spectrum of design, manufacturing, and testing. Many concepts are proposed for the first time, and readers will benefit from the concurrent engineering and co-design approaches to advanced engineering design of LED products. One of the only books to cover LEDs from package design to manufacturing to testing Focuses on the design of LED packaging and its applications such as road lights Includes design methods and experiences necessary for LED engineers, especially optical and thermal design Introduces novel LED packaging structures and manufacturing processes, such as ASLP Covers reliability considerations, the most challenging problem for the LED industry Provides measurement and testing standards, which are critical for LED development, for both LED and LED fixtures Codes and demonstrations available from the book’s Companion Website This book is ideal for practicing engineers working in design or packaging at LED companies and graduate students preparing for work in industry. This book also provides a helpful introduction for advanced undergraduates, graduates, researchers, lighting designers, and product managers interested in the fundamentals of LED design and production. Color version of selected figures can be found at www.wiley.com/go/liu/led

Nitride Semiconductor Light-Emitting Diodes (LEDs)

Nitride Semiconductor Light-Emitting Diodes (LEDs)
Materials, Technologies, and Applications

by Jian-Jang Huang,Hao-Chung Kuo,Shyh-Chiang Shen

  • Publisher : Woodhead Publishing
  • Release : 2017-10-24
  • Pages : 822
  • ISBN : 0081019432
  • Language : En, Es, Fr & De
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Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications, Second Edition reviews the fabrication, performance and applications of the technology, encompassing the state-of-the-art material and device development, along with considerations regarding nitride-based LED design. This updated edition is based on the latest research and advances, including two new chapters on LEDs for large displays and laser lighting. Chapters cover molecular beam epitaxy (MBE) growth of nitride semiconductors, modern metalorganic chemical vapor deposition (MOCVD) techniques, the growth of nitride-based materials, and gallium nitride (GaN)-on-sapphire and GaN-on-silicon technologies for LEDs. Nanostructured, non-polar and semi-polar nitride-based LEDs, as well as phosphor-coated nitride LEDs, are also discussed. The book also addresses the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots. Further chapters discuss the development of LED encapsulation technology and fundamental efficiency droop issues in gallium indium nitride (GaInN) LEDs. It is a technical resource for academics, physicists, materials scientists, electrical engineers, and those working in the lighting, consumer electronics, automotive, aviation, and communications sectors. Features new chapters on laser lighting, addressing the latest advances on this topic Reviews fabrication, performance, and applications of this technology that encompass the state-of-the-art material and device development Covers the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots Highlights applications of nitride LEDs, including liquid crystal display (LCD) backlighting, infra-red emitters, and automotive lighting Provides a comprehensive discussion of gallium nitride on both silicon and sapphire substrates

Solid State Lighting Reliability Part 2

Solid State Lighting Reliability Part 2
Components to Systems

by Willem Dirk van Driel,Xuejun Fan,Guo Qi Zhang

  • Publisher : Springer
  • Release : 2017-08-13
  • Pages : 606
  • ISBN : 3319581759
  • Language : En, Es, Fr & De
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In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new and unknown failure modes have also been presented. In this book, Solid State Lighting Reliability Part 2, we invited the experts from industry and academia to present the latest developments and findings in the LED system reliability arena. Topics in this book cover the early failures and critical steps in LED manufacturing; advances in reliability testing and standards; quality of colour and colour stability; degradation of optical materials and the associated chromaticity maintenance; characterization of thermal interfaces; LED solder joint testing and prediction; common failure modes in LED drivers; root causes for lumen depreciation; corrosion sensitivity of LED packages; reliability management for automotive LEDs, and lightning effects on LEDs. This book is a continuation of Solid State Lighting Reliability: Components to Systems (published in 2013), which covers reliability aspects ranging from the LED to the total luminaire or system of luminaires. Together, these two books are a full set of reference books for Solid State Lighting reliability from the performance of the (sub-) components to the total system, regardless its complexity.

Proceedings

Proceedings
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1998
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Science Abstracts

Science Abstracts
Electrical & electronics abstracts. Series B

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1995
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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MEMS Reliability for Critical and Space Applications

MEMS Reliability for Critical and Space Applications
21-22 September, 1999, Santa Clara, California

by Russell A. Lawton

  • Publisher : Society of Photo Optical
  • Release : 1999
  • Pages : 176
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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A selection of scientific papers on the reliability of microelectromechanical systems (MEMS) for critical and space applications.

Failure Mechanisms in Semiconductor Devices

Failure Mechanisms in Semiconductor Devices
A Book

by E. Ajith Amerasekera,Farid N. Najm

  • Publisher : Wiley-Blackwell
  • Release : 1997-08-04
  • Pages : 345
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.

1999 IEEE International Reliability Physics Symposium Proceedings

1999 IEEE International Reliability Physics Symposium Proceedings
37th Annual, San Diego, California, March 23-25, 1999

by International Reliability Physics Symposium

  • Publisher : Unknown Publisher
  • Release : 1999
  • Pages : 448
  • ISBN : 9780780352216
  • Language : En, Es, Fr & De
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Proceedings

Proceedings
low-cost manufacturing technologies for tomorrow's global economy ; 1994 IEMT Symposium ; September 12-14, 1994, La Jolla, CA, USA.. Product demonstrations. 2

by International Electronics Manufacturing Technology Symposium (16, 1994, La Jolla, Calif.)

  • Publisher : Unknown Publisher
  • Release : 1994
  • Pages : 329
  • ISBN : 9780780320383
  • Language : En, Es, Fr & De
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Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures: Volume 184

Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures: Volume 184
A Book

by V. Swaminathan,S. J. Pearton,M. O. Manasreh

  • Publisher : Materials Research Society
  • Release : 1990
  • Pages : 269
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Index to IEEE Publications

Index to IEEE Publications
A Book

by Institute of Electrical and Electronics Engineers

  • Publisher : Unknown Publisher
  • Release : 1997
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Issues for 1973- cover the entire IEEE technical literature.

Program and Abstracts for the ... U.S. National Congress of Theoretical and Applied Mechanics

Program and Abstracts for the ... U.S. National Congress of Theoretical and Applied Mechanics
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2002
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium, October 2-4, 1995, Austin, TX, USA

Seventeenth IEEE/CPMT International Electronics Manufacturing Technology Symposium, October 2-4, 1995, Austin, TX, USA
Manufacturing Technologies--present and Future

by Walt Trybula

  • Publisher : Institute of Electrical & Electronics Engineers(IEEE)
  • Release : 1995
  • Pages : 516
  • ISBN : 9780780329973
  • Language : En, Es, Fr & De
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Java/Jini Technologies

Java/Jini Technologies
21-22 August 2001, Denver, USA

by Sudipto Ghosh

  • Publisher : Society of Photo Optical
  • Release : 2001
  • Pages : 154
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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AT&T Technical Journal

AT&T Technical Journal
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1985
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conferences--2005

Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conferences--2005
Presented at 2005 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference : September 24-28, 2005, Long Beach, California, USA

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2005
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Compound Semiconductor

Compound Semiconductor
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 2003
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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Electrical & Electronics Abstracts

Electrical & Electronics Abstracts
A Book

by Anonim

  • Publisher : Unknown Publisher
  • Release : 1997
  • Pages : 329
  • ISBN : 9876543210XXX
  • Language : En, Es, Fr & De
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